Digital Systems Testing And Testable Design Solution High Quality

Some common testable design techniques include:

A high-quality solution for digital systems testing and testable design relies on Design for Testability (DFT)

For high-end systems, relying on external Automated Test Equipment (ATE) can be slow and expensive. embeds the "tester" directly onto the silicon. Logic BIST (LBIST): Used for testing random logic.