ATPG algorithms generate the input vectors required to detect faults. The industry standard is the and its successors (like PODEM and FAN), which use path sensitization and backtrace techniques to propagate a fault to an observable output. Modern ATPG tools are "fault-oriented," calculating patterns to achieve >95% stuck-at fault coverage.
The process of generating tests involves two main steps: fault activation and fault propagation. To detect a fault, a specific logic value must be applied to the fault site (activation), and the resulting erroneous signal must be driven to an observable output pin (propagation). As circuit depth increases, this process becomes computationally expensive, a problem known as the "state explosion" in Automatic Test Pattern Generation (ATPG). digital systems testing and testable design solution
To achieve a testable digital system, developers and engineers often utilize: ATPG algorithms generate the input vectors required to